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Terrestrial Neutron Induced Soft Errors in Advanced Memory Devices

on Jan 10,2009 in Science/Engineering comment »

Takashi Nakamura, Eishi Yahagi, Hideaki Kameyama, "Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices"

World Scientific Publishing Company | 2008 | ISBN: 9812778810 | 368 pages | PDF | 12,3 MB

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and…