• Results 1 - 10 of about 1 for "Memory Devices". (0.05 seconds)

Terrestrial Neutron Induced Soft Errors in Advanced Memory Devices

Takashi Nakamura, Eishi Yahagi, Hideaki Kameyama, "Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices"

World Scientific Publishing Company | 2008 | ISBN: 9812778810 | 368 pages | PDF | 12,3 MB

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and…